The EL tester is a special test equipment for defect detection and production process monitoring of components according to the electroluminescence principle of silicon materials. The infrared test method is used to test the battery module to achieve the EL imaging mode, so that it can be checked whether there is a battery sheet inside the battery module, such as cracked, cracked, black core, sintered broken gate, virtual welding, desoldering, etc. The next process.
Since the light emitted by the power has a great relationship with the ion concentration in the PN junction, it is possible to judge whether the inside of the silicon wafer is abnormal according to the image reflected by the EL computer, thereby ensuring the quality of the solar cell module. Whether the solar cell is defective or not needs to be judged by the EL detector. Such a process of detecting and sorting can greatly reduce the circulation and sales of the defective solar cell on the market, thereby reducing the power loss of the component at a small level. Therefore, the quality inspection of solar cell wafers is particularly important in production and experimentation.
In daily experiments and applications, our more commonly used battery wafer defect inspection is the use of EL defect detectors. After the EL defect detector passes the current of 1-1.5 times Isc, the silicon wafer emits 1000-1100nm infrared light to detect the defects of the solar cell wafer, which further helps to improve the solar cell module production process, thereby controlling the quality of the product itself and improving the whole. The component yield rate largely avoids production waste.