Many defects in solar panel silicon wafers are not detected using conventional imaging systems. A method called electroluminescence imaging is required. The corresponding device is the solar module EL tester, and the system is used in quantum efficiency. A near-infrared industrial camera with excellent sensitivity and sensitivity, based on the principle of electroluminescence, has developed a high-efficiency imaging system for the silicon solar panel inspection system that works in the near-infrared spectrum.
The solar module EL tester is widely used in various inspection systems on the market to enable defect detection and quality inspection of solar panels in a weak infrared environment. The method of detection is to apply a direct current to the solar module and measure the photoelectric effect by an infrared sensitive industrial camera.
With proper tuning and configuration, the system accurately detects defects and aging in a very short time. The amount of luminescence generated by the battery when a given current is applied can also be used to measure the conversion efficiency of the solar cell. In the process of detecting defects in silicon solar panels, the amount of electroluminescence due to the photovoltaic effect is very weak, requiring the use of extremely sensitive cameras, and also requires an excellent set of software for studying the dark defects, uniformity and Overall efficiency, solar module EL tester can meet the requirements.